The laboratory conducts metrological research on the characterisation of innovative materials (nano-enabled materials, graphene, and topological insulators) and on electrical and electrochemical device building blocks (electrodes, current collectors, and membranes), including the development of novel calibration procedures for impedance spectroscopy and conductivity mapping techniques.

The laboratory is dedicated to the metrological characterisation of thin-film materials and prototype devices, including sensors and energy storage components. Its activities focus on establishing reliable and traceable measurement methods for materials that play a critical role in advanced technologies.

Innovative nano-enabled materials such as graphene and other thin-film materials are relevant to metrology itself,  while others like nanowire networks and carbon-based porous layers are investigated for their applications in electronics and energy storage.

Accurate determination of electrical conductivity, its spatial uniformity across the sample area, and impedance over defined frequency ranges enables extraction of key control parameters. The reliability of these parameters directly influences the accuracy of experimental results and the efficiency and performance of devices built from these materials. Particular attention is given to spatially resolved measurements and frequency-dependent behaviour, which are essential for understanding transport mechanisms and interface phenomena.

To support these objectives, the laboratory develops novel calibration procedures to strengthen measurement traceability. This includes improving traceability for established techniques such as the van der Pauw method, establishing traceability frameworks for emerging approaches such as electrical resistance tomography, and addressing calibration challenges in techniques requiring a large number of measurement points or wide frequency coverage, such as electrical impedance spectroscopy. Through these activities, the laboratory contributes to enhancing measurement reliability, comparability, and metrological robustness in advanced material and device characterisation.