The Spectroscopy and Metrology Laboratory for Micro/Nanomaterials is dedicated to the chemical, physical, and dimensional characterization of materials and particles in complex matrices, with applications in environmental, food, and industrial fields. The laboratory is equipped with optical spectroscopy systems, including Raman, FTIR, UV-Vis, and fluorescence, enabling non-destructive analysis of solid, liquid, and gaseous matrices and providing a highly specific and reliable chemical fingerprint.

The non-destructive nature of spectroscopic techniques allows the detection and identification of contaminants and chemical species of interest in organic matrices, on industrial surfaces, and in complex samples, preserving sample integrity and ensuring measurement reproducibility.

The laboratory includes two FTIR spectrometers for mid- and near-infrared analysis, interfaced with microscopes and motorized micro-stages for surface chemical imaging, as well as a long optical path (6 m) gas cell for trace gas analysis. The instrumentation also comprises four micro-Raman spectrometers equipped with multiple excitation wavelengths (266, 455, 532, 633, 780 nm), featuring motorized stages for microanalysis and coupling with gas cells. UV-Vis and fluorescence spectrophotometers are available for quantitative analyses.

Particular emphasis is placed on high-sensitivity Raman techniques such as SERS and TERS. The laboratory integrates Raman spectroscopy with nanostructured plasmonic materials for signal enhancement (SERS) and operates an AFM-Raman system for correlative chemical-morphological analysis and TERS applications, enabling nanometer-scale characterization.

In addition to spectroscopic techniques, dimensional characterization and separation methods such as AFM, DLS, and AF4 are integrated, along with correlative and hyphenated systems for micro- and nanoparticle analysis. Innovative devices, including dielectrophoretic cells integrated with Raman spectroscopy, are developed for selective manipulation and identification of particles in suspension.

These activities support metrology at the micro- and nanoscale, contributing to the development of reliable, high-sensitivity methods for the identification and quantification of micro/nanomaterials and contaminants.