Metrology applied to nanomaterials and methods of analysis

The research activity in nanometrology has among its main objectives the development and characterisation of nanostructured materials to support measurement methods with high sensitivity and resolution (eg. Surface Enhanced Raman Scattering, Tip Enhanced Raman Scattering), the development of correlative chemical-imaging measurement (e.g. AFM-Raman) and/or hyphenated methods (AF4-DLS-Raman) for the identification of micro/nanoparticles in complex matrices (e.g. micro / nanoplastics), and the production of nanomaterials with active properties (e.g. antibacterial).

Wet chemistry approaches and advanced fabrication methods of micro/nano-structured substrates are used to obtain standard nanoscale materials of different shapes, sizes and compositions (e.g. gold or silver nanospheres) to be used as a signal amplification system Raman in the detection of trace food contaminants (eg pesticides), for the study of complex biological matrices and for the chemical-morphological characterization of surfaces of industrial interest.

The development of methods based on Raman spectroscopy also makes it possible to coordinate and participate in interlaboratory metrological comparisons within the CCQM Surface Analysis Working Group (SAWG) and in the pre-regulatory environment of VAMAS.