The patent is one of the tools we use to return the products of scientific research to society. At the same time, it is a means that protects both the inventor and those who want to use the invention on an entrepreneurial level.
INRiM adheres to Knowledge Share, a joint project involving Politecnico di Torino, Italian Patent and Trademark Office (UIBM) at MISE (Ministry for Economic Development) and Netval. Here all the information on each single patent is published: Knowledge Share INRiM.
Home therapy for patients with chronic neuropathic pain or disorders of consciousness, it allows for remote management of the patient. Rif. INRiM_015.
Self-assembled networks of nanowires that allow the creation of a "hardware" architecture for neuromorphic computation. Ref. INRiM_014
ROTOENCODER, an encoder capable of measuring absolute angles with very high resolution and great accuracy. Ref. INRiM_001
Technique based on the information obtained from the propagation of illuminating light for the generation of 3D images of the object. Rif. INRiM_016
Reference Materials KIT allows the calibration of road luminance coefficient measuring devices, portable and of laboratory. Ref. INRiM_013
Compact and economical laser with better stability and frequency tuning than standard models on the market. Ref. INRiM 010
3D printed Reference Materials for street lighting, with values equal to those required by road regulations. Ref. INRiM_012
Conductance measurement techniques of ultrasonic transducers, using a periodic electrical signal and submersible load cell. Ref. INRiM_002
Nanoconstruct and ultrasound activation set-up able to treat tumor cell and induce them to death with no need of chemotherapeutic drugs. Ref. INRiM_009
Optical Pressure Sensor «counts» the photons scattered by the molecules of the gas, thus measuring the density of the gas. Ref. INRiM_005
Method developed to enable the real-time monitoring of arc flash events occurring in railway and metropolitan systems. Rif. INRiM_011
Screen for transcranial magnetic equipment; reduces exposure to magnetic fields by up to three orders of magnitude. Ref. INRiM_004
Sample for the calibration of length measurements at the nanoscale, for AFM tips or for measurement of grains using X-ray techniques. Ref. INRiM_006
