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CIE EXPERT
SYMPOSIUM
on
Advances in Photometry and Colorimetry
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7-8 July 2008
Turin (Torino), Italy
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Symposium Co-Chairs
Yoshi Ohno
National Institute of Standards and Technology,
Gaithersburg, MD, USA
e-mail: ohno@nist.gov
Tel: +1 301-975-2321
Maria Luisa Rastello
Istituto Nazionale di Ricerca Metrologica (INRIM),
Torino, Italy
e-mail: m.rastello@inrim.it
Tel: +39 011-39-19-219
Organizing
Committee
- Martina
Paul
- Maria
Luisa Rastello
- Yoshi
Ohno
- Armin
Sperling
- George
Sauter
- Norb
Johnson
- Guy
Vandermeersch
- Jim
Gardner
- Peter
Blattner
Local Organizing
Contact
Elisabetta Melli
Istituto
Nazionale di Ricerca Metrologica
(INRIM)
Strada delle Cacce 91 - 10135 Torino, Italy
e-mail: e.melli@inrim.it Tel:
+39 011-39-19-524 Fax: +39
011-34-63-84
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